Title :
Non-destructive testing of microstrip antenna substrate material
Author_Institution :
Boeing Aerospace Company, Seattle, WA, USA
Keywords :
Dielectric constant; Dielectric measurements; Dielectric substrates; Fabrication; Image reconstruction; Materials testing; Microstrip antenna arrays; Microstrip antennas; Nondestructive testing; Reconstruction algorithms;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1984
Conference_Location :
Boston, MA, USA
DOI :
10.1109/APS.1984.1149315
