Title :
Evaluation of residual DC of LC cell
Author :
Nakazono, Yuji ; Takagi, Toshiyuki ; Sawada, Atsushi ; Naemura, Shohei
Author_Institution :
Atsugi Tech. Center, Merck Japan Ltd., Kanagawa, Japan
Abstract :
Residual DC phenomenon is discussed based on the simulation with equivalent circuit of LC cell and experiments for three kind of cells which has different alignment layer with different specific resistivity values. Interfacial and dipole polarization of multi layered dielectrics is caused by DC voltage application. The r-DC observed in short time range (few min.) can be explained by this polarization. Even after the interfacial polarization is relaxed, however, some amount of ions, which moved close to the interface between the LC and the alignment layers, remain for a longer time due to an adsorption phenomenon. The observed r-DC voltage for a longer time range, typically over 1 hour, can be explained by this model of ion adsorption
Keywords :
dielectric polarisation; equivalent circuits; interface phenomena; liquid crystal displays; simulation; AMLCD; DC voltage application; active matrix LCD; adsorption phenomenon; alignment layer; dipole polarization; equivalent circuit; interfacial polarization; ion adsorption model; liquid crystal cell; multilayered dielectrics; residual DC evaluation; residual DC phenomenon; simulation; specific resistivity values; Circuit simulation; Conductivity; Dielectrics; Displays; Electric potential; Equivalent circuits; Personal communication networks; Polarization; RLC circuits; Voltage;
Conference_Titel :
Information Display, 1999. ASID '99. Proceedings of the 5th Asian Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
957-97347-9-8
DOI :
10.1109/ASID.1999.762750
