Title :
Automated 3D X-ray Inspection Of Fine Pitch PCB´s
Author :
Hanke, R.F. ; Weiss, T. ; Petsch, N.
Author_Institution :
Fraunhofer Institute for Integrated Circuits
Keywords :
Automatic control; Data acquisition; Data mining; Focusing; Image reconstruction; Inspection; Soldering; System testing; Tomography; X-ray imaging;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
DOI :
10.1109/IEMT.1992.639888
