DocumentCode

2779855

Title

Automated 3D X-ray Inspection Of Fine Pitch PCB´s

Author

Hanke, R.F. ; Weiss, T. ; Petsch, N.

Author_Institution

Fraunhofer Institute for Integrated Circuits

fYear

1992

fDate

28-30 Sep 1992

Firstpage

187

Lastpage

190

Keywords

Automatic control; Data acquisition; Data mining; Focusing; Image reconstruction; Inspection; Soldering; System testing; Tomography; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International

Print_ISBN

0-7803-0755-0

Type

conf

DOI

10.1109/IEMT.1992.639888

Filename

639888