• DocumentCode
    2780044
  • Title

    Bit-Error-Rate measurement for an All-optical Set-Reset Flip-Flop based on semiconductor ring laser

  • Author

    Vidal, Maria J Latorre ; Zanola, Marco ; Mezosi, G. ; Trita, Andrea ; Sorel, Marc ; Giuliani, Guido

  • Author_Institution
    Dipt. di Elettron., Univ. di Pavia, Pavia, Italy
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    In this work, the authors report on the demonstration of a monolithic semiconductor ring laser (SRL) as an all-optical set-reset flip-flop (SRFF). The SRL has a racetrack cavity, with 150 mum radius connecting two straight sections of 200 mum. Two straight output waveguides provide 4 input/output ports that can be used to inject/extract optical signals. The devices operate continuous wave at room temperature, with threshold currents between 35 and 60 mA, emitting up to 3 mW at lambda= 1550-1570 nm. The SRL exhibits inherent directional bistability: lasing action can occur unidirectionally either in the clockwise (CW) or in the counter-clockwise (CCW) direction. The lasing direction of the bistable SRL can be switched by an external optical signal that is injected into the SRL in the direction to be activated, with a response time around 100 ps.
  • Keywords
    error statistics; flip-flops; optical logic; ring lasers; semiconductor lasers; all optical set reset flip flop; bit error rate measurement; continuous wave operation; current 30 mA to 60 mA; monolithic semiconductor ring laser; power 3 mW; size 150 mum; size 200 mum; temperature 293 K to 298 K; wavelength 1550 nm to 1570 nm; Flip-flops; Joining processes; Optical bistability; Optical waveguides; Ring lasers; Semiconductor lasers; Semiconductor waveguides; Stimulated emission; Temperature; Waveguide lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5191779
  • Filename
    5191779