Title :
Localizing light using metamaterial nanotips
Author :
Rockstuhl, C. ; Simovski, C.R. ; Tretyakov, S.A. ; Lederer, F.
Author_Institution :
Inst. of Condensed Matter Theor. & Solid State Opt., Friedrich-Schiller-Univ. Jena, Jena, Germany
Abstract :
Light localization using metamaterial (MM) nanotip is proposed. The structure is made of densely packed metallic nanoparticles. Such a MM shows strong dispersion with a Lorentzian line shape in the effective permittivity. The resonance is centred at the frequency where the collective localized plasmon polariton is excited. At wavelengths smaller than the resonance wavelength, the effective permittivity is negative. It allows exciting localized plasmon polaritons at the nanotip apex thus causing strong field localization in tiny volumes. At wavelengths slightly larger than the resonance wavelength, whispering gallery modes can be observed inside the nanotip. The smallest features of the light pattern are governed by the classical resolution criteria. However, as the effective index is huge the feature sizes are extremely small. Increasing the operational wavelength further will turn the medium to be a reasonable dielectric material with negligible absorption. It allows for a strong focusing of the light behind the apex where it propagates nearly free of diffraction.
Keywords :
metamaterials; nanoparticles; nanophotonics; optical focusing; permittivity; polaritons; surface plasmon resonance; whispering gallery modes; Lorentzian line shape; collective localized plasmon polariton; effective index; effective permittivity; light focusing; light localization; metallic nanoparticles; metamaterial nanotips; resonance wavelength; whispering gallery modes; Dielectric materials; Dispersion; Frequency; Metamaterials; Nanoparticles; Permittivity; Plasmons; Resonance; Shape; Whispering gallery modes;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5191790