Title :
Behavioral models of digital IC ports from measured transient waveforms
Author :
Stievano, I.S. ; Maio, I.A.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
Abstract :
This paper addresses the behavioral modeling of output ports of digital integrated circuits via the identification of nonlinear parametric models. The aim of the approach is to produce models for signal integrity (SI) simulation directly from the measured transient responses of the devices. The modeling process is thoroughly described and an experimental demonstration of its feasibility is given
Keywords :
circuit simulation; digital integrated circuits; integrated circuit measurement; integrated circuit modelling; integrated circuit reliability; nonlinear network analysis; transient analysis; transient response; behavioral modeling; behavioral models; digital IC ports; digital integrated circuits; measured transient responses; measured transient waveforms; modeling process; nonlinear parametric models; output ports; signal integrity simulation; Circuit simulation; Digital integrated circuits; Drives; Equations; Equivalent circuits; Integrated circuit measurements; Integrated circuit modeling; Logic; Parametric statistics; Predictive models;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2000, IEEE Conference on.
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-7803-6450-3
DOI :
10.1109/EPEP.2000.895530
