Automatic Stress and Load Testing for Embedded Systems

Load and stress testing are important to guarantee the system is able to support specified load conditions as well as properly recover from the excess use of resources. The generation of test cases to achieve levels of load and stress is a demanding task. Here we propose an approach for the automatic generation of test cases to achieve specified levels of load and stress for a combination of resources. The technique is based on the use of a PID controller to drive the inputs to the desired levels. The preliminary results are a good indication of the potential of the approach