DocumentCode :
2780586
Title :
Early Software Reliability Prediction with Extended ANN Model
Author :
Hu, Q.P. ; Dai, Y.S. ; Xie, M. ; Ng, S.H.
Author_Institution :
Dept. of Ind. & Syst. Eng., National Univ. of Singapore
Volume :
2
fYear :
2006
fDate :
17-21 Sept. 2006
Firstpage :
234
Lastpage :
239
Abstract :
Generally, software reliability models can provide accurate reliability measurement in the later phase of testing. However, predictions in the early phase of software testing are useful as cost-effective and timely feedback. Early prediction is also feasible in practice with information from previous releases or similar projects. Such information has been utilized well for early reliability prediction with NHPP models by assuming the same failure rate between two similar projects. Alternatively, in this paper, we propose to "reuse" failure data from past projects/releases with ANN models to improve early reliability for current project/release. To illustrate the proposed approach, two numerical examples are developed. Better prediction performance is observed in early phase of testing compared with original ANN model without failure data reuse. Furthermore, the optimal switching point from proposed approach to original ANN model in the whole testing phase is studied, with specific analysis on the two examples
Keywords :
neural nets; program testing; software reliability; artificial neural network; nonhomogeneous Poisson process model; optimal switching point; software reliability model; software testing; Artificial neural networks; Data analysis; Information analysis; Predictive models; Process control; Reliability engineering; Resource management; Software measurement; Software reliability; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference, 2006. COMPSAC '06. 30th Annual International
Conference_Location :
Chicago, IL
ISSN :
0730-3157
Print_ISBN :
0-7695-2655-1
Type :
conf
DOI :
10.1109/COMPSAC.2006.130
Filename :
4020173
Link To Document :
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