Title :
The Effect of Charge Injection on EHD Conduction Pumping
Author :
Yazdani, Miad ; Seyed-Yagoobi, Jamal
Author_Institution :
Senior Res. Eng., United Technol. Res. Center, East Hartford, CT, USA
Abstract :
Electrohydrodynamics (EHD) conduction pumping takes advantage of Coulomb force generated by externally applied electric field and dissociated charges from electrolytes present in the working fluid. With the electric field maintained below the DC breakdown limit, EHD conduction generated flow relies primarily upon the asymmetry of the electrodes where the flow is always generated toward the specific direction regardless of the electrodes polarity. The charge distribution induced by the process of dissociation may be altered by charge injection, potentially present at the electrodes´ surfaces. The charge injection could occur, for example, because of the electrode surface roughness. This paper is a numerical investigation to quantify the impact of the charge injection on the performance of EHD conduction pump. The numerical domain comprises a coplanar asymmetric electrode pair embedded against a 2-D channel wall with the EHD conduction induced liquid flow expected to be generated from the narrower electrode toward the wider electrode. The electric field, net charge density, and electric body force distributions are presented in the absence and presence of charge injection. In addition, the electrically generated net flow is calculated for several operating conditions.
Keywords :
channel flow; charge injection; dissociation; electrohydrodynamics; electrolytes; numerical analysis; pumps; 2-D channel wall; Coulomb force; DC breakdown limit; EHD conduction induced liquid flow; EHD conduction pumping; charge injection; dissociated charges; dissociation; electric body force distribution; electrodes polarity; electrolytes; externally applied electric field; surface roughness; Dielectric liquids; Electric potential; Electrodes; Force; Ions; Numerical models; Solids;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2010 IEEE
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4244-6393-0
DOI :
10.1109/IAS.2010.5616849