Title :
Texture classification using wavelet decomposition with Markov random field models
Author :
Wang, Lei ; Liu, Jun ; Li, Stan Z.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
We present a new scheme to classify different textures. In the past years, wavelet decomposition has been used in texture classification. The usual features of classification are energy and entropy. In this paper, we propose a scheme to use wavelet decomposition with Markov random field models, the parameters of each Markov random field models are used as features in texture classification. Thus we can analyze the textures with Markov random field models on different scales with the wavelet decomposition
Keywords :
Markov processes; image classification; image texture; wavelet transforms; Markov random field; image texture; pattern classification; texture classification; wavelet decomposition; Discrete wavelet transforms; Entropy; Image processing; Image segmentation; Image texture analysis; Layout; Markov random fields; Power engineering and energy; Surface texture; Wavelet analysis;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.712024