DocumentCode :
2780795
Title :
Several narrowband matching networks for quasi-TEM coupled microstrip lines
Author :
Nickel, Josh G. ; Schutt-Aine, Jose E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
2000
fDate :
2000
Firstpage :
296
Lastpage :
299
Abstract :
For multiconductor transmission line (MTL) systems, “matching” occurs in the context of multiple propagating modes and requires minimization of the reflection coefficient matrix function, one of the governing MTL longitudinal immittance matrix functions (LIMFs). This paper presents the synthesis of several matching strategies (stubs, reactances, transformers) for symmetric, coupled-line microstrip structures mismatched with several simple passive terminations. Optimization of matching network parameters yields significant reflection reduction resulting from the termination mismatches. Measurement of synthesized structures verifies the reflection reduction and power savings. General n-coupled line applications include coupled-microstrip transistor amplifiers, optoelectronics packaging, chip- and package-level interconnections, and parallel data buses
Keywords :
coupled transmission lines; electromagnetic wave reflection; impedance matching; integrated circuit interconnections; integrated circuit packaging; matrix algebra; microstrip lines; minimisation; mode matching; multiconductor transmission lines; MTL longitudinal immittance matrix functions; MTL systems; chip-level interconnections; coupled-microstrip transistor amplifiers; general n-coupled line applications; matching network parameters; matching strategies; minimization; multiconductor transmission line systems; multiple propagating mode matching; narrowband matching networks; optimization; optoelectronics packaging; package-level interconnections; parallel data buses; passive terminations; power savings; quasi-TEM coupled microstrip lines; reactances; reflection coefficient matrix function; reflection reduction; stubs; symmetric coupled-line microstrip structure mismatch; symmetric coupled-line microstrip structures; synthesized structure measurement; termination mismatch; transformers; Couplings; Microstrip; Multiconductor transmission lines; Narrowband; Network synthesis; Packaging; Reflection; Symmetric matrices; Transformers; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2000, IEEE Conference on.
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-7803-6450-3
Type :
conf
DOI :
10.1109/EPEP.2000.895549
Filename :
895549
Link To Document :
بازگشت