Title :
Toward film-silicon solar cells on display glass
Author :
Young, David L. ; Alberi, Kirstin ; Teplin, Charles ; Martin, Ina ; Stradins, Paul ; Shub, Maxim ; Beall, Carolyn ; Iwaniczko, Eugene ; Guthrey, Harvey ; Romero, Manuel J. ; Chuang, Ta-Ko ; Mozdy, E. ; Branz, Howard M.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
We describe recent progress in developing epitaxial film crystal silicon (c-Si) solar cells that can be grown at low temperature (<;760 °C) on seed-on-glass substrates. This low-cost approach is enabled by rapid epitaxy (up to 300 nm/min) of Si films with low dislocation density (<; 1×105 cm-2) at glass-compatible temperatures by hot-wire chemical vapor deposition (HWCVD). Epitaxial test cells on heavily-doped ´dead´ Si wafers provide insight into the quality of the Si absorber and the physics that limit device performance. Our best 2-3 μm thick, film silicon heterojunction (c-Si/a-Si) solar cells have reached ~6.7% efficiency (Voc ~ 570 mV, Jsc ~18 mA/cm-2) without rapid thermal anneal, defect passivation or light trapping. Unpassivated dislocations are strong recombination centers and limit effective minority carrier diffusion lengths to less than 15-20 μm (roughly half the distance between dislocations). We also report devices without light-trapping on layer-transfer Si seed layers bonded to display-glass; these seed layers template growth of high-quality HWCVD cSi. Our initial devices have Voc = 460 mV, Jsc = 16.2 mA/cm2, Eff. = 4.8 %, but will benefit from post-growth anneals, hydrogenation and new surface treatments before epitaxy. We discuss junction transport physics in the devices and explore the role of post-growth H-passivation and rapid thermal annealing treatments on device performance.
Keywords :
CVD coatings; carrier lifetime; electron-hole recombination; epitaxial growth; glass; passivation; rapid thermal annealing; solar cells; Si; dislocation density; display glass; efficiency 4.8 percent; epitaxial film crystal silicon solar cell; film silicon solar cell; hot wire chemical vapor deposition; junction transport; minority carrier diffusion; post-growth H-passivation; rapid epitaxy; rapid thermal annealing; recombination center; unpassivated dislocation; voltage 460 mV;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5616860