Evaluation Of Thin-film MCM Materials For High-speed Applications
Author :
Salmon, Linton G.
Author_Institution :
Brigham Young University
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
219
Lastpage :
222
Keywords :
Capacitance; Dielectric constant; Dielectric losses; Dielectric materials; Frequency; Integrated circuit interconnections; Material properties; Power system interconnection; System performance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
