DocumentCode
2780957
Title
Evaluation Of Thin-film MCM Materials For High-speed Applications
Author
Salmon, Linton G.
Author_Institution
Brigham Young University
fYear
1992
fDate
28-30 Sep 1992
Firstpage
219
Lastpage
222
Keywords
Capacitance; Dielectric constant; Dielectric losses; Dielectric materials; Frequency; Integrated circuit interconnections; Material properties; Power system interconnection; System performance; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN
0-7803-0755-0
Type
conf
DOI
10.1109/IEMT.1992.639894
Filename
639894
Link To Document