Cu2ZnSnS4 thin-film solar cell absorber composition revealed by energy-dispersive and soft x-ray emission spectroscopy

Author

Bär, M. ; Schubert, B. ; Marsen, B. ; Unold, T. ; Wilks, R.G. ; Schock, H.W. ; Pookpanratana, S. ; Blum, M. ; Krause, S. ; Zhang, Y. ; Heske, C. ; Yang, W. ; Weinhardt, L.

Author_Institution

Solar Energy Res., Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH, Berlin, Germany

fYear

2010

fDate

20-25 June 2010

Abstract

Different Cu₂ZnSnS₄ (CTZS) thin-film solar cell absorbers have been investigated by bulk-sensitive energy-dispersive spectroscopy (EDS) and surface-near bulk-sensitive soft x-ray emission spectroscopy (XES). While we find a good agreement between the computed Zn/Sn composition ratio based on the EDS and XES data, the XES determined Cu/(Zn+Sn) composition ratio significantly deviates from that based on EDS measurements for some samples. While the first can be explained by a homogenous Zn/Sn composition throughout the CTZS samples, the latter is interpreted as a variation of the Cu depth profile in the respective thin-film solar cell absorbers.

Keywords

X-ray chemical analysis; copper compounds; semiconductor thin films; solar cells; tin compounds; zinc compounds; Cu₂ZnSnS₄; absorber composition; energy-dispersive x-ray spectroscopy; soft x-ray emission spectroscopy; thin-film solar cell;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE

Conference_Location

Honolulu, HI

ISSN

0160-8371

Print_ISBN

978-1-4244-5890-5

Type

conf

DOI

10.1109/PVSC.2010.5616878

Filename

5616878