DocumentCode :
2781249
Title :
Application of Automated Model Generation Techniques to Analog/Mixed-Signal Circuits
Author :
Little, Scott ; Sen, Alper ; Myers, Chris
Author_Institution :
Sch. of Comput., Univ. of Utah, Salt Lake City, UT
fYear :
2007
fDate :
5-6 Dec. 2007
Firstpage :
109
Lastpage :
115
Abstract :
Abstract models of analog/mixed-signal (AMS) circuits can be used for formal verification and system-level simulation. The difficulty of creating these models precludes their widespread use. This paper presents an automated method to generate abstract models appropriate for system-level simulation and formal verification. This method uses simulation traces and thresholds on the design variables to generate a piecewise-linear representation of the system. This piecewise-linear representation can be converted to a Verilog-AMS model or a Labeled Hybrid Petri Net formal model. Results are presented for the model generation, simulation, and verification of a PLL phase detector circuit.
Keywords :
Petri nets; analogue circuits; circuit simulation; digital simulation; formal verification; hardware description languages; mixed analogue-digital integrated circuits; phase detectors; phase locked loops; piecewise linear techniques; PLL phase detector circuit; Verilog-AMS model; analog/mixed-signal circuit; automated model generation technique; formal verification; labeled hybrid Petri net formal model; piecewise-linear representation; system-level simulation; Analog computers; Automatic testing; Circuit simulation; Circuit testing; Cities and towns; Computer bugs; Formal verification; Hardware design languages; Microprocessors; Piecewise linear techniques; mixed-signal circuit; modeling; verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification, 2007. MTV '07. Eighth International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
978-0-7695-3241-7
Type :
conf
DOI :
10.1109/MTV.2007.17
Filename :
4620159
Link To Document :
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