DocumentCode
2781314
Title
Low temperature reactive ion etching for bulk micromachining
Author
Shimizu, Seiji ; Kuribayashi, Katsutoshi ; Ohno, Manabu ; Taniguchi, Taliao ; Ueda, Tetsuo
Author_Institution
Yamaguchi Univ., Japan
fYear
1994
fDate
6-10 Nov. 1994
Firstpage
48
Lastpage
52
Abstract
To make three dimensional micron structures, the directional deep etching techniques are very important. The directional wet etching technique is often used for the bulk micromachining. However, directions of the wet deep etching and profiles of products are restricted by the crystalline orientation of silicon substrate. To solve this problem, high speed and deep directional dry etching processes have been studied. The low temperature reactive ion etching (RIE) apparatus for the bulk micromachining was fabricated and the etching characteristics were investigated. The high etch rate of 0.022 /spl mu/m/s and the low normalized side etch ratio of 0.021 were realized at the cathode temperature of -80/spl deg/C. The etch rate is equal or a little higher than that of the directional wet etching.<>
Keywords
micromachining; micromechanical devices; silicon; sputter etching; substrates; -80 degC; bulk micromachining; cathode temperature; crystalline orientation; directional wet etching; low temperature reactive ion etching; silicon substrate; wet deep etching; Cathodes; Crystallization; Dry etching; Electrodes; Micromachining; Silicon; Substrates; Temperature; Valves; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies and Factory Automation, 1994. ETFA '94., IEEE Symposium on
Conference_Location
Tokyo, Japan
Print_ISBN
0-7803-2114-6
Type
conf
DOI
10.1109/ETFA.1994.402024
Filename
402024
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