DocumentCode :
2781505
Title :
Analysis of Hall Factor in Isotropic Polysilicon
Author :
Lubimsky, V.M. ; Moiseev, A.G.
Author_Institution :
Novosibirsk State Technical University, Novosibirsk, Russia
fYear :
2005
fDate :
13-15 Dec. 2005
Firstpage :
13
Lastpage :
16
Abstract :
A model of isotropic polycrystal is proposed. All crystallites are regarded as spheres having the same diameter d. The distance between the centers of the spheres cannot be less than d. The distribution of the centers of the crystallites in the polycrystal is described by the radial distribution function given by the rigid spheres model. In the framework of the model the charge carriers relaxation time τbon potential barriers, taking place at the surfaces of the crystallites, is dependent only on energy ε of the charge carrier (τb= τb(ε)). The calculation of the Hall-factor caused by the scattering on the potential barriers in the polycrystalline silicon is presented.
Keywords :
Charge carriers; Conductivity; Crystallization; Distribution functions; Electric potential; Equations; Kinetic theory; Potential well; Scattering; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Electronics: Measurements, Identification, Applications, 2005. MEMIA '05. 5th International Conference on
Print_ISBN :
5-7782-0554-6
Type :
conf
DOI :
10.1109/MEMIA.2005.247501
Filename :
1716951
Link To Document :
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