Title :
Effects of load connection in accelerated aging of a-Si:H solar cell for long term reliability test
Author :
Park, Sang Hyun ; Kim, Kyung Min ; Cho, Jun-Sik ; Lee, Jeong Chul ; Kang, Gi-Hwan ; Choi, Duck-Kyun ; Yoon, Kyung Hoon ; Song, Jinsoo
Author_Institution :
Photovoltaic Res. Center, Korean Inst. of Energy Res., Daejeon, South Korea
Abstract :
To establish reliable model for long term reliability of a-Si:H PV module, outdoor field aging results and indoor light soaking test has been investigated. For the appropriate comparisons, one type of outdoor system modules and test cells has been fabricated from the same commercial module production line. Severe early stage degradation in outdoor site has been resulted and compared to the indoor aging results. Detailed experiment of indoor aging tests depends on both load condition and cell temperature has been investigated.
Keywords :
ageing; amorphous semiconductors; elemental semiconductors; hydrogen; reliability; silicon; solar cells; PV module; Si:H; accelerated aging; amorphous solar cell; cell temperature; commercial module production line; indoor light soaking test; load connection effect; long term reliability test; outdoor field aging; outdoor system modules;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5616898
