Title :
Time domain analysis for the packet loss and bit error distribution in high-speed network
Author :
Xu, Xiaoxiao ; Shou, Guochu ; Hu, Yihong
Author_Institution :
Sch. of Inf. & Commun. Eng., Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
The frame error at the data link layer in high-speed optical access network was investigated. The Gigabit Ethernet test bed was established including a network tester, a variable optical attenuator, optical link and a purpose-built tool which allows us to examine errors on a per-octet basis. The test bed transmits pre-constructed test data frames in a standard format and captures error-containing frames for purpose-built tool and statistical tool later analysis. From the experiment results we find that bit error, fragments and extra-bit frame all lead to frame error, resulting in packet loss in high-speed optical network. The distributions of frame error, byte error and extra-bit frame are distinct on the different attenuation conditions and the same happens with different frame lengths. We also find that regardless of the extra-bit frame effect, the packet loss and bit error obey the Poisson distribution in the different parameters, and that the distribution of extra-bit frame varies depending on the length of the frames transmitted.
Keywords :
Poisson distribution; error statistics; optical attenuators; optical fibre LAN; time-domain analysis; Ethernet; Poisson distribution; bit error distribution; byte error; error-containing frames; extra-bit frame; high-speed optical access network; network tester; optical link; packet loss; purpose-built tool; statistical tool; time domain analysis; variable optical attenuator; Ethernet networks; High speed optical techniques; High-speed networks; Optical attenuators; Optical fiber communication; Optical fiber networks; Optical losses; Propagation losses; Testing; Time domain analysis; distribution; extra-bit frame; frame error; high-speed access network;
Conference_Titel :
Network Infrastructure and Digital Content, 2009. IC-NIDC 2009. IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4898-2
Electronic_ISBN :
978-1-4244-4900-6
DOI :
10.1109/ICNIDC.2009.5360861