• DocumentCode
    2781925
  • Title

    Temperature of solar cells in reverse bias: Theory and applications

  • Author

    Rim, Seung ; Baldrias, Maristel ; Morse, Mike

  • Author_Institution
    SunPower Corp., San Jose, CA, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Solar cells are reversely biased, consume power generated by neighbor cells and become hot when they are shaded or do not function properly. It is necessary to quickly measure their temperatures and accurately estimate them for screening. This paper presents the theory behind thermal emission measurement under constant current reverse bias and estimation methods of steady state temperatures of cells and modules. A simple physical model describes thermal emission measurement system based on knowledge that heat is transferred by heat convection, conduction and radiation and the power is fed by electrical bias. We confirm the model by short time thermal emission measurement and electrical current voltage characterizations. A quantitative and quick estimation method of steady state temperatures is presented based on the model. This model applies to estimate the temperature of modules by incorporating thermal resistance. The results also suggest that low temperature can be achieved by low reverse voltage or low thermal resistance. This study helps to understand physics behind reversely biased solar cells to develop a quick and convenient method to estimate steady state temperature of cells and modules.
  • Keywords
    convection; heat conduction; solar cells; temperature measurement; constant current reverse bias method; electrical current voltage characterizations; heat conduction; heat convection; heat radiation; reversely biased solar cells; steady state temperature estimation; thermal emission measurement system; Photovoltaic cells; Steady-state; Temperature; Temperature measurement; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616916
  • Filename
    5616916