Title :
High resolution radar imaging using coherent multiband processing techniques
Author :
Van Dorp, Philip ; Ebeling, Rob ; Huizing, Albert G.
Author_Institution :
Radar Dept., TNO Defence, Security & Safety, The Hague, Netherlands
Abstract :
High resolution radar imaging techniques can be used in ballistic missile defence systems to determine the type of ballistic missile during the boost phase (threat typing) and to discriminate different parts of a ballistic missile after the boost phase. The applied radar imaging technique is 2D Inverse Synthetic Aperture Radar (2D-ISAR) in which the Doppler shifts of various parts of the ballistic missile are employed to obtain a high cross-range resolution while the resolution in downrange is achieved with a large radar bandwidth. For a 10 cm downrange resolution, a radar bandwidth of more than 1.5 GHz is required. However, this requirement is not compatible with EM frequency spectrum allocations for long range ballistic missile defence radars that operate in the L, S, and C frequency band. In this paper, a novel coherent multiband ISAR imaging technique is proposed that employs two or more narrowband radar systems that operate in different frequency bands. The coherent multiband imaging process uses an advanced interpolation technique to achieve a very high downrange resolution and produces little artifacts due to noise.
Keywords :
interpolation; military radar; missiles; radar imaging; synthetic aperture radar; 2D inverse synthetic aperture radar; Doppler shift; EM frequency spectrum allocation; ballistic missile defence systems; boost phase; coherent multiband imaging; coherent multiband processing; high cross-range resolution; high resolution radar imaging; interpolation technique; multiband ISAR imaging; narrowband radar systems; radar bandwidth; Bandwidth; Doppler radar; Doppler shift; High-resolution imaging; Image resolution; Inverse synthetic aperture radar; Missiles; Radar imaging; Radio spectrum management; Synthetic aperture radar;
Conference_Titel :
Radar Conference, 2010 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-5811-0
DOI :
10.1109/RADAR.2010.5494478