Title :
A variable-size parallel regenerator for long integrated interconnections
Author :
Nekili, Mohamed ; Savaria, Yvon ; Bois, Guy
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Ecole Polytech. de Montreal, Que., Canada
Abstract :
This paper presents a low-power and low-area variant of the recently proposed parallel regeneration technique (PRT), thus providing an improved technique for the regeneration of long integrated interconnects. Taking advantage of the particular design of the regenerator in PRT, we propose a variant (called VPRT), where the regenerators along the interconnection have a variable size. Electrical simulations involving different interconnection lengths and technological processes are carried out to show that the interconnection delay, obtained with VPRT, is smaller than with PRT. A performance analysis combining area (A), delay (T), and power dissipation (P) shows that VPRT leads to an ATP metric at least 4 times better than with PRT
Keywords :
VLSI; delays; digital integrated circuits; integrated circuit design; integrated circuit interconnections; VLSI chips; area; delay; electrical simulations; interconnection delay; interconnection lengths; long integrated interconnections; parallel regeneration technique; performance analysis; power dissipation; technological processes; variable-size parallel regenerator; Computer science; Delay; Driver circuits; Integrated circuit interconnections; Logic; Measurement; Performance analysis; Power dissipation; Power system interconnection; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
DOI :
10.1109/MWSCAS.1994.519188