• DocumentCode
    2782088
  • Title

    A variable-size parallel regenerator for long integrated interconnections

  • Author

    Nekili, Mohamed ; Savaria, Yvon ; Bois, Guy

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    1
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    50
  • Abstract
    This paper presents a low-power and low-area variant of the recently proposed parallel regeneration technique (PRT), thus providing an improved technique for the regeneration of long integrated interconnects. Taking advantage of the particular design of the regenerator in PRT, we propose a variant (called VPRT), where the regenerators along the interconnection have a variable size. Electrical simulations involving different interconnection lengths and technological processes are carried out to show that the interconnection delay, obtained with VPRT, is smaller than with PRT. A performance analysis combining area (A), delay (T), and power dissipation (P) shows that VPRT leads to an ATP metric at least 4 times better than with PRT
  • Keywords
    VLSI; delays; digital integrated circuits; integrated circuit design; integrated circuit interconnections; VLSI chips; area; delay; electrical simulations; interconnection delay; interconnection lengths; long integrated interconnections; parallel regeneration technique; performance analysis; power dissipation; technological processes; variable-size parallel regenerator; Computer science; Delay; Driver circuits; Integrated circuit interconnections; Logic; Measurement; Performance analysis; Power dissipation; Power system interconnection; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519188
  • Filename
    519188