Title :
Recognition of integrated circuit images in reverse engineering
Author :
Lagunovsky, D. ; Ablameyko, S. ; Kutas, M.
Author_Institution :
Inst. of Eng. Cybernetics, Acad. of Sci., Minsk, Byelorussia
Abstract :
One of areas where reverse engineering is used is integrated circuit (IC) production. Part of an existing IC topology can be utilised during design of a new IC. In this paper, we propose a method to automatically recognise IC elements and to obtain IC description from an IC layer image. The main distinguishing features of the proposed method are stability in respect to noise and low error percentage. To speed-up the processing, the special fast algorithms for edge detection, image vectorisation and reconstruction of vector representation have been developed
Keywords :
circuit CAD; edge detection; image recognition; integrated circuit design; reverse engineering; vector quantisation; IC element recognition; IC layer image; IC production; IC topology; edge detection; image vectorisation; integrated circuit image recognition; noise stability; reverse engineering; vector representation reconstruction; Image recognition; Reverse engineering;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.712032