DocumentCode :
2782321
Title :
Effects of preannealing on positively electron-beam charged SiO2 electrets
Author :
Günther, P.
Author_Institution :
Technical University of Darmstadt
fYear :
1991
fDate :
1991
Firstpage :
145
Lastpage :
150
Keywords :
Capacitance measurement; Capacitance-voltage characteristics; Current measurement; Electrets; Electrodes; Electron emission; Probes; Surface charging; Temperature; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
Type :
conf
DOI :
10.1109/CEIDP.1991.763349
Filename :
763349
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2782321
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