Title :
Downlink admission control strategies for CDMA systems in a Manhattan environment
Author :
Knutsson, Jens ; Butovitsch, Peter ; Persson, Magnus ; Yates, Roy D.
Author_Institution :
Ericsson Radio Syst., Stockholm, Sweden
Abstract :
Downlink admission control strategies and downlink power control strategies, for CDMA systems in a Manhattan environment, are investigated by simulation experiments. Different admission policies are compared by investigating system capacity versus grade of annoyance, defined as a weighted combination of call blocking and call dropping probabilities, or by just viewing the call dropping probabilities. The admission decision is based on output power levels from base stations (BSs) and the investigation focuses on whether the admission decision should be based on measurements from one BS or measurements from several BSs. Simulations indicate that the admission algorithms do not gain much from using information from more than one cell. However, using information from more than one cell decreases the call dropping probability for very high loads. Further, the performances of the proposed downlink algorithms are not as good as for some previously studied uplink admission control algorithms. Finally, having a maximum output power constraint on a BS basis instead of on a channel basis decreases the call dropping probability
Keywords :
cellular radio; code division multiple access; power control; radio links; telecommunication congestion control; CDMA systems; Manhattan environment; admission decision; base stations; call blocking probability; call dropping probability; cellular radio; downlink admission control strategies; downlink power control strategies; grade of annoyance; simulation experiments; system capacity; Admission control; Call admission control; Computational modeling; Computer networks; Computer simulation; Downlink; Intelligent networks; Multiaccess communication; Power engineering computing; Power generation;
Conference_Titel :
Vehicular Technology Conference, 1998. VTC 98. 48th IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-4320-4
DOI :
10.1109/VETEC.1998.686520