Title :
Poly-P-Xylene film for high temperature high voltage dielectric applications
Author :
Suthar, J.L. ; Laghari, J.R. ; Khechan, W.
Author_Institution :
State University of New York at Buffalo
Keywords :
Dielectric constant; Dielectric loss measurement; Dielectric measurements; Electric variables measurement; Frequency; Space missions; Space technology; Temperature distribution; Testing; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
DOI :
10.1109/CEIDP.1991.763365
