DocumentCode :
2782560
Title :
Dispatching Rules For Semiconductor Testing Operations: A Computational Study
Author :
Uzsoy, Reha ; Church, Laura K. ; Ovacik, Irfan M. ; Hinchman, Jim
Author_Institution :
Purdue University
fYear :
1992
fDate :
28-30 Sep 1992
Firstpage :
272
Lastpage :
276
Keywords :
Automatic testing; Circuit testing; Dispatching; Integrated circuit testing; Job shop scheduling; Packaging; Performance evaluation; Semiconductor device testing; Temperature; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
Type :
conf
DOI :
10.1109/IEMT.1992.639903
Filename :
639903
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2782560
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