DocumentCode
2782633
Title
Bayesian parametric approach for multichannel adaptive signal detection
Author
Wang, Pu ; Li, Hongbin ; Himed, Braham
Author_Institution
Dept. of Electr. & Comput. Eng., Stevens Inst. of Technol., Hoboken, NJ, USA
fYear
2010
fDate
10-14 May 2010
Firstpage
838
Lastpage
841
Abstract
This paper considers the problem of space-time adaptive processing (STAP) in non-homogeneous environments, where the disturbance covariance matrices of the training and test signals are assumed random and different with each other. A Bayesian detection statistic is proposed by incorporating the randomness of the disturbance covariance matrices, utilizing a priori knowledge, and exploring the inherent Block-Toeplitz structure of the spatial-temporal covariance matrix. Specifically, the Block-Toeplitz structure of the covariance matrix allows us to model the training signals as a multichannel auto-regressive (AR) process and hence, develop the Bayesian parametric adaptive matched filter (B-PAMF) to mitigate the training requirement and alleviate the computational complexity. Simulation using both simulated multichannel AR data and the challenging KASSPER data validates the effectiveness of the B-PAMF in non-homogeneous environments.
Keywords
Toeplitz matrices; adaptive signal detection; autoregressive processes; covariance matrices; space-time adaptive processing; Bayesian detection; Bayesian parametric approach; block-Toeplitz structure; computational complexity; multichannel adaptive signal detection; multichannel auto-regressive process; space-time adaptive processing; spatial-temporal covariance matrix; Adaptive signal detection; Adaptive signal processing; Aerospace electronics; Bayesian methods; Computational complexity; Computational modeling; Covariance matrix; Parametric statistics; Signal processing; Testing; Bayesian detection; Parametric adaptive matched filter; non-homogeneous environments; space-time adaptive signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar Conference, 2010 IEEE
Conference_Location
Washington, DC
ISSN
1097-5659
Print_ISBN
978-1-4244-5811-0
Type
conf
DOI
10.1109/RADAR.2010.5494503
Filename
5494503
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