Title :
Electrical Characterization Of Glass, Teflon, And Tantalum Capacitors At High Temperatures
Author :
Hammoud, A.N. ; Baumann, E.D. ; Myers, I.T. ; Overton, E.
Author_Institution :
Sverdrup Technology, Inc.
Keywords :
Capacitance; Capacitors; Dielectric losses; Dielectric materials; Glass; Leakage current; Performance evaluation; Space technology; Temperature distribution; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
DOI :
10.1109/CEIDP.1991.763371
