Title :
Tip-to-sample distance control in apertureless near-field optical microscopy
Author :
Milner, A.A. ; Zhang, Kaiyin ; Prior, Yehiam
Author_Institution :
Department of Chemical Physics, Weizmann Institute of Science, Rehovot, 76100 Israel
Abstract :
Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
Keywords :
Atom optics; Atomic force microscopy; Force feedback; Force measurement; Optical control; Optical feedback; Optical microscopy; Optical sensors; Probes; Resonance light scattering;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431050
