Title :
Development Of An Alternative Wire Bond Test Technique
Author :
Lall, Pradeep ; Barker, Donald ; Pecht, Michael
Author_Institution :
University of Maryland
Keywords :
Bonding forces; Educational institutions; Electronic equipment testing; Electronics packaging; Geometry; Inspection; Process control; Quality assurance; Ultra large scale integration; Wire;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1992., Thirteenth IEEE/CHMT International
Print_ISBN :
0-7803-0755-0
DOI :
10.1109/IEMT.1992.639905