DocumentCode :
2783013
Title :
Statistical analysis of cycle times in a complex microelectronics manufacturing line
Author :
Barkany, Silvia ; Fromm, Hansjörg ; Gihr, Ottmar ; Solf, Bernhard
Author_Institution :
IBM German Manufacturing Technology Center (GMTC)
fYear :
1992
fDate :
1992
Firstpage :
18
Lastpage :
25
Keywords :
Costs; Databases; Electronics industry; Manufacturing industries; Microelectronics; Monitoring; Production systems; Pulp manufacturing; Statistical analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
Print_ISBN :
0-7803-0629-5
Type :
conf
DOI :
10.1109/IEMT.1992.763393
Filename :
763393
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2783013
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