Title :
OLED Device Operational Lifetime: Insights and Challenges
Author :
Xia, Sean C. ; Kwong, Raymond C. ; Adamovich, Vadim I. ; Weaver, Michael S. ; Brown, Julie J.
Author_Institution :
Universal Display Corp., Ewing, NJ
Abstract :
This paper discusses some of the most important intrinsic and extrinsic factors that affect the organic light-emitting devices (OLEDs) stability. OLEDs lifetime can be greatly improved through materials design by improving the redox properties, thermal properties, and charge transporting properties. Extrinsic factors, such as materials purity, are also discussed.
Keywords :
life testing; organic light emitting diodes; semiconductor device reliability; semiconductor device testing; OLED device operational lifetime; OLED stability; charge transporting properties; materials purity; organic light-emitting devices; phosphorescence; redox properties; thermal properties; Active matrix technology; Excitons; Flat panel displays; Fluorescence; Optical devices; Organic light emitting diodes; Phosphorescence; Stability; Stimulated emission; Transistors; OLED; PHOLED; lifetime; phosphorescence; stability;
Conference_Titel :
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location :
Phoenix, AZ
Print_ISBN :
1-4244-0919-5
Electronic_ISBN :
1-4244-0919-5
DOI :
10.1109/RELPHY.2007.369901
