Title : 
Automatic gang bonding, the alternative process
         
        
            Author : 
Schiebel, Gunter
         
        
            Author_Institution : 
Siemens AG
         
        
        
        
        
        
            Keywords : 
Bonding; Inspection; Laser beams; Lead; Position measurement; Printers; Quality assurance; Semiconductor device measurement; Signal resolution; Vacuum systems;
         
        
        
        
            Conference_Titel : 
Electronic Manufacturing Technology Symposium, 1992. IEMT 1992. 12th International
         
        
            Print_ISBN : 
0-7803-0629-5
         
        
        
            DOI : 
10.1109/IEMT.1992.763405