Title :
Design for probabilistic testing
Author_Institution :
New Brunswick Univ., Fredericton, NB, Canada
Abstract :
Probabilistic diagnosis can be used against intermittent faults, since it uses only data associated with faulty system operation. Also, the procedure can use on-line system data as diagnostic objects. It is thus suitable for incorporation into systems for use during normal operation, and in particular therefore, in intentionally-designed fault-tolerant systems. Probabilistic diagnosis is described with respect to bus faults, instruction faults, switching system faults and system architecture faults
Keywords :
VLSI; fault tolerant computing; integrated circuit testing; bus faults; design for testability; diagnostic objects; fault-tolerant systems; instruction faults; intermittent faults; probabilistic testing; switching system faults; system architecture faults; use during normal operation;
Conference_Titel :
Design for Testability, IEE Colloquium on
Conference_Location :
London
