Title :
A testing device for reliability of camera IR cut switching
Author :
He, Teng ; Yunzhou, Zhang ; Chengdong, Wu ; Hao, Wu
Author_Institution :
Coll. of Inf. Sci. & Eng., Northeastern Univ., Shengyang, China
Abstract :
In this paper, the current problems of CMOS camera and other image sensors in grabbing image are briefly analyzed and the current solutions are introduced. To solve the current issues that reliability of camera´s IR cut switch device cannot be ensured, a testing device for detecting reliability of IR cut switch device is designed. The testing device is used to drive the IR cut switching and test its reliability. Besides, the useful information of testing is shown in the device. The concrete design scheme and key technology including circuit design and software flow are given in the paper. Several modes including two testing modes, testing number and frequency can be set to the testing device so that it can work in many modes to test kinds of IR cut switch devices. The testing device has the advantages of high accuracy and easy operation.
Keywords :
CMOS image sensors; infrared imaging; integrated circuit design; integrated circuit reliability; CMOS camera; camera IR; circuit design; cut switching; image sensors; software flow; testing device; Light emitting diodes; Microcontrollers; Optical filters; Optical switches; Reliability; Testing; CMOS camera; IR cut switch; Reliability; Testing device;
Conference_Titel :
Mechatronics and Automation (ICMA), 2011 International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8113-2
DOI :
10.1109/ICMA.2011.5986283
