• DocumentCode
    2783594
  • Title

    ZnO films with very high haze ratio prepared by MOCVD technique

  • Author

    Yunaz, Ihsanul Afdi ; Hongsingthong, Aswin ; Zhang, Liping ; Miyajima, Shinsuke ; Konagai, Makoto

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    We have successfully fabricated zinc oxide (ZnO) films with a very high haze value using metal organic chemical vapor deposition (MOCVD) technique by conducting a glass substrate etching before film deposition. Effect of glass treatment time on the properties of ZnO films was investigated. It was found that the surface morphology of ZnO films can be modified by adjusting the glass treatment time without preserving their good transparency and electrical properties. Using boron-doped ZnO (ZnO:B) films with a high haze value as front TCO films in thin film Si solar cells, we improved the quantum efficiency of these cells particularly in the long-wavelength region. Thus, the obtained ZnO:B films have a lot of potentials to be used as the front TCO layers in silicon-based thin film solar cells.
  • Keywords
    MOCVD; boron; elemental semiconductors; etching; solar cells; surface morphology; thin films; zinc compounds; MOCVD; MOCVD technique; Si; ZnO:B; film deposition; glass substrate etching; glass treatment time; metal organic chemical vapor deposition; quantum efficiency; surface morphology; thin film solar cell; Films; Glass; Morphology; Photovoltaic cells; Substrates; Surface morphology; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617007
  • Filename
    5617007