DocumentCode
2783594
Title
ZnO films with very high haze ratio prepared by MOCVD technique
Author
Yunaz, Ihsanul Afdi ; Hongsingthong, Aswin ; Zhang, Liping ; Miyajima, Shinsuke ; Konagai, Makoto
Author_Institution
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
fYear
2010
fDate
20-25 June 2010
Abstract
We have successfully fabricated zinc oxide (ZnO) films with a very high haze value using metal organic chemical vapor deposition (MOCVD) technique by conducting a glass substrate etching before film deposition. Effect of glass treatment time on the properties of ZnO films was investigated. It was found that the surface morphology of ZnO films can be modified by adjusting the glass treatment time without preserving their good transparency and electrical properties. Using boron-doped ZnO (ZnO:B) films with a high haze value as front TCO films in thin film Si solar cells, we improved the quantum efficiency of these cells particularly in the long-wavelength region. Thus, the obtained ZnO:B films have a lot of potentials to be used as the front TCO layers in silicon-based thin film solar cells.
Keywords
MOCVD; boron; elemental semiconductors; etching; solar cells; surface morphology; thin films; zinc compounds; MOCVD; MOCVD technique; Si; ZnO:B; film deposition; glass substrate etching; glass treatment time; metal organic chemical vapor deposition; quantum efficiency; surface morphology; thin film solar cell; Films; Glass; Morphology; Photovoltaic cells; Substrates; Surface morphology; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5617007
Filename
5617007
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