Title :
Reliability Assessment of 1.55-μM Vertical Cavity Surface Emitting Lasers for Optical Communication Systems
Author :
Rhew, Keun Ho ; Jeon, Su Chang ; Kwon, O-Kyun ; Lee, Dae Hee ; Yoo, Byung Soo ; Yun, Ilgu
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
Abstract :
In this paper, the long-term reliability of all monolithic 1.55-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variations of properties that depend on the operating conditions are characterized via the threshold current, the dark current, and the optical output power. The median device lifetime is extrapolated and the activation energy of the degradation mechanism for the VCSEL test structures is calculated. From these results, the long-term reliability of the VCSEL test structures for high-speed optical communication systems can be determined.
Keywords :
life testing; optical communication; reliability; surface emitting lasers; VCSEL test structures; accelerated life test; degradation mechanism; high-speed optical communication systems; reliability assessment; vertical cavity surface emitting lasers; Dark current; High speed optical techniques; Life estimation; Life testing; Optical fiber communication; Power system reliability; Stimulated emission; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers; accelerated life test; long-term reliability; vertical cavity surface emitting laser;
Conference_Titel :
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location :
Phoenix, AZ
Print_ISBN :
1-4244-0918-7
Electronic_ISBN :
1-4244-0919-5
DOI :
10.1109/RELPHY.2007.369937
