• DocumentCode
    2783747
  • Title

    Reliability of High-Power IGBT Modules for Traction Applications

  • Author

    Ciappa, Mauro ; Castellazzi, Alberto

  • Author_Institution
    Integrated Syst. Lab., Swiss Fed. Inst. of Technol., Zurich
  • fYear
    2007
  • fDate
    15-19 April 2007
  • Firstpage
    480
  • Lastpage
    485
  • Abstract
    The enhancement of the system efficiency in conjunction with a reduction of weight and volume in transportation applications requires high temperature power devices with reduced losses and with an optimized thermal management. This paper addresses the main technology issues and some recently-developed design tools to be considered in order to reach the imposed reliability level.
  • Keywords
    insulated gate bipolar transistors; reliability; thermal management (packaging); traction; transportation; high temperature power devices; high-power IGBT modules; optimized thermal management; power device reliability; traction applications; transportation applications; Automotive engineering; Circuits; Cooling; Energy management; Insulated gate bipolar transistors; Power system reliability; Rail transportation; Technology management; Temperature; Thermal management; IGBT; Power device reliability; electromagnetic simulation; simulation; thermal management; traction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    1-4244-0919-5
  • Electronic_ISBN
    1-4244-0919-5
  • Type

    conf

  • DOI
    10.1109/RELPHY.2007.369938
  • Filename
    4227679