Title :
Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation
Author :
Douin, A. ; Pouget, V. ; Lewis, D. ; Fouillat, P. ; Perdu, P.
Author_Institution :
IMS, Talence
Abstract :
This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
Keywords :
VLSI; failure analysis; timing; digital test structures; integrated circuits; picosecond timing analysis; pulsed laser stimulation; temporal resolution; Circuit analysis; High speed optical techniques; Laser mode locking; Laser modes; Optical beams; Optical pulses; Pulse circuits; Stimulated emission; Timing; Ultrafast optics;
Conference_Titel :
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location :
Phoenix, AZ
Print_ISBN :
1-4244-0919-5
Electronic_ISBN :
1-4244-0919-5
DOI :
10.1109/RELPHY.2007.369945
