DocumentCode
278397
Title
Wafer-scale integration-an international perspective
Author
Aubusson, R.C.
Author_Institution
WSI Consultants, Wirral, UK
fYear
1991
fDate
33386
Firstpage
42370
Lastpage
42373
Abstract
This paper reviews some major international activity in Wafer-Scale Integration, with a view to identifying what priority and direction should be given to further UK development of WSI technology and applications following the completion of the $21/2 M Alvey project `A Design Methodology For WSI´. Based on recently published papers and with particular emphasis on work reported in the Proceedings of the International Conference on Wafer-Scale Integration in San Francisco, 29-31 January, 1991, an attempt is made to assess the relative significance of ongoing work, to assist in defining an appropriate strategy for continued UK development of WSI applications and technology
Keywords
VLSI; integrated circuit technology; UK development; WSI applications; WSI technology; Wafer-Scale Integration; international activity; strategy;
fLanguage
English
Publisher
iet
Conference_Titel
Wafer Scale Integration, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
181663
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