• DocumentCode
    278397
  • Title

    Wafer-scale integration-an international perspective

  • Author

    Aubusson, R.C.

  • Author_Institution
    WSI Consultants, Wirral, UK
  • fYear
    1991
  • fDate
    33386
  • Firstpage
    42370
  • Lastpage
    42373
  • Abstract
    This paper reviews some major international activity in Wafer-Scale Integration, with a view to identifying what priority and direction should be given to further UK development of WSI technology and applications following the completion of the $21/2 M Alvey project `A Design Methodology For WSI´. Based on recently published papers and with particular emphasis on work reported in the Proceedings of the International Conference on Wafer-Scale Integration in San Francisco, 29-31 January, 1991, an attempt is made to assess the relative significance of ongoing work, to assist in defining an appropriate strategy for continued UK development of WSI applications and technology
  • Keywords
    VLSI; integrated circuit technology; UK development; WSI applications; WSI technology; Wafer-Scale Integration; international activity; strategy;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Wafer Scale Integration, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    181663