Title :
Wafer-scale integration-an international perspective
Author_Institution :
WSI Consultants, Wirral, UK
Abstract :
This paper reviews some major international activity in Wafer-Scale Integration, with a view to identifying what priority and direction should be given to further UK development of WSI technology and applications following the completion of the $21/2 M Alvey project `A Design Methodology For WSI´. Based on recently published papers and with particular emphasis on work reported in the Proceedings of the International Conference on Wafer-Scale Integration in San Francisco, 29-31 January, 1991, an attempt is made to assess the relative significance of ongoing work, to assist in defining an appropriate strategy for continued UK development of WSI applications and technology
Keywords :
VLSI; integrated circuit technology; UK development; WSI applications; WSI technology; Wafer-Scale Integration; international activity; strategy;
Conference_Titel :
Wafer Scale Integration, IEE Colloquium on
Conference_Location :
London