Title :
Testing for Threshold Logic Circuits Based on Resonant Tunneling Diodes
Author :
Kuang, Weidong ; Banatoski, Edward
Author_Institution :
Department of Electrical Engineering, University of Texas — Pan American, Edinburg, TX 78541, U.S.A., Email: kuangw@panam.edu
Abstract :
This paper proposes comprehensive fault models to accommodate the typical manufacturing defects in resonant tunneling diode (RTD) threshold logic integrated circuits. The defects, such as device (field-effect transistor or RTD) short or open, can be modeled as conditional stuck-at fault models. The errors due to the RTD size variations are abstracted as threshold-change fault models. A testing methodology based on the proposed fault models is presented.
Keywords :
RTD; fault model; testing; Circuit faults; Circuit testing; Diodes; Integrated circuit manufacture; Integrated circuit modeling; Logic circuits; Logic testing; Pulp manufacturing; Resonant tunneling devices; Virtual manufacturing; RTD; fault model; testing;
Conference_Titel :
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN :
1-4244-0077-5
DOI :
10.1109/NANO.2006.247658
