DocumentCode :
2784267
Title :
Analysis of the spontaneous emission rate enhancement by surface plasmons in a thin metallic layer embedded in semiconductor
Author :
Iwase, Hideo ; Vuckovic, Jelena
Author_Institution :
Production Engineering Laboratory, Canon Inc., 3-38-1, Shimomaruko, Ohta-ku, Kanagawa, 146-8501, Japan
fYear :
2007
fDate :
6-11 May 2007
Firstpage :
1
Lastpage :
2
Abstract :
We study the modification of spontaneous emission rates from multi-quantum wells beneath a thin metallic layer embedded in semiconductor.
Keywords :
Absorption; Fabrication; Frequency estimation; Gold; Indium phosphide; Optical devices; Optical surface waves; Plasmons; Refractive index; Spontaneous emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
Type :
conf
DOI :
10.1109/QELS.2007.4431131
Filename :
4431131
Link To Document :
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