Title :
An Investigation of External Latchup
Author :
Farbiz, Farzan ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois, Univ., Urbana, IL
Abstract :
Circuits are more susceptible to external latchup at elevated temperatures not only because the PNPN trigger current is lowered, but also because the minority carrier collection efficiency is increased. Collection efficiency does not scale linearly with the dimensions of the N-well. PNPN structures that are oriented perpendicular to a substrate current injector are more susceptible to latchup than are those oriented parallel
Keywords :
flip-flops; minority carriers; PNPN trigger current; external latchup; minority carrier collection efficiency; substrate current injector; Circuits; Detectors; Diodes; Electrons; Electrostatic discharge; Latches; Power supplies; Temperature distribution; Temperature sensors; Voltage;
Conference_Titel :
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location :
Phoenix, AZ
Print_ISBN :
1-4244-0919-5
Electronic_ISBN :
1-4244-0919-5
DOI :
10.1109/RELPHY.2007.369970
