DocumentCode
2784539
Title
A total internal reflection technique for time resolved measurements of index of refraction
Author
Houser, John R. ; Bernstein, Aaron C. ; Ditmire, Todd
Author_Institution
The University of Texas at Austin, Fusion Research Center, 1 University Station, C1510, 78712, USA
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
We present a method using total-internal reflection for measuring small index-of-refraction changes (¿n=1x10-5). The technique overcomes requirements of diffraction-limited laser performance, is auto-calibrating, and paves the way for sensitive single-shot ultrafast measurements of material dynamics.
Keywords
Charge coupled devices; Laser beams; Optical diffraction; Optical reflection; Optical refraction; Optical sensors; Phase measurement; Plasma measurements; Time measurement; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location
Baltimore, MD, USA
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/QELS.2007.4431147
Filename
4431147
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