Title :
A total internal reflection technique for time resolved measurements of index of refraction
Author :
Houser, John R. ; Bernstein, Aaron C. ; Ditmire, Todd
Author_Institution :
The University of Texas at Austin, Fusion Research Center, 1 University Station, C1510, 78712, USA
Abstract :
We present a method using total-internal reflection for measuring small index-of-refraction changes (¿n=1x10-5). The technique overcomes requirements of diffraction-limited laser performance, is auto-calibrating, and paves the way for sensitive single-shot ultrafast measurements of material dynamics.
Keywords :
Charge coupled devices; Laser beams; Optical diffraction; Optical reflection; Optical refraction; Optical sensors; Phase measurement; Plasma measurements; Time measurement; Ultrafast optics;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431147
