DocumentCode
2784616
Title
Influence of Dopant Concentration on the Electrical Transport at Low Temperature in Silicon Nanowires
Author
Ionica, Irina ; Montés, L. ; Zimmermann, J. ; Ionica, Irina ; Saminadayar, L. ; Bouchiat, V.
Author_Institution
Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS-INPG-UJF 5130, Grenoble, France, irina.ionica@grenoble.cnrs.fr
Volume
2
fYear
2006
fDate
17-20 June 2006
Firstpage
425
Lastpage
428
Abstract
We demonstrate the correlation between the the doping atoms concentration and the Coulomb blockade phenomenon in silicon nanowires. At room and intermediate temperatures nanowires show a field effect, while at low temperature current oscillations due to Coulomb blockade dominate transport close to the conduction threshold. Detailed experimental results on samples with two different doping levels allowed Coulomb blockade to be related to the presence of the dopants. In the limit of a few dopants per cross section, as for low doping level (2.5×1017cm-3), the electrical behavior of the nanowire is similar to that of a one dimensional array of dots. In nanowires with a high doping level (1019cm-3), transport can be modeled on the basis of a two dimensional arrays of dots.
Keywords
Coulomb blockade; doping level; nanowires; tunnel junction arrays; Atomic force microscopy; Doping; Fabrication; Fluctuations; Lithography; Nanostructures; Nanowires; Semiconductor process modeling; Silicon; Temperature; Coulomb blockade; doping level; nanowires; tunnel junction arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN
1-4244-0077-5
Type
conf
DOI
10.1109/NANO.2006.247678
Filename
1717128
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