• DocumentCode
    2784616
  • Title

    Influence of Dopant Concentration on the Electrical Transport at Low Temperature in Silicon Nanowires

  • Author

    Ionica, Irina ; Montés, L. ; Zimmermann, J. ; Ionica, Irina ; Saminadayar, L. ; Bouchiat, V.

  • Author_Institution
    Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS-INPG-UJF 5130, Grenoble, France, irina.ionica@grenoble.cnrs.fr
  • Volume
    2
  • fYear
    2006
  • fDate
    17-20 June 2006
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    We demonstrate the correlation between the the doping atoms concentration and the Coulomb blockade phenomenon in silicon nanowires. At room and intermediate temperatures nanowires show a field effect, while at low temperature current oscillations due to Coulomb blockade dominate transport close to the conduction threshold. Detailed experimental results on samples with two different doping levels allowed Coulomb blockade to be related to the presence of the dopants. In the limit of a few dopants per cross section, as for low doping level (2.5×1017cm-3), the electrical behavior of the nanowire is similar to that of a one dimensional array of dots. In nanowires with a high doping level (1019cm-3), transport can be modeled on the basis of a two dimensional arrays of dots.
  • Keywords
    Coulomb blockade; doping level; nanowires; tunnel junction arrays; Atomic force microscopy; Doping; Fabrication; Fluctuations; Lithography; Nanostructures; Nanowires; Semiconductor process modeling; Silicon; Temperature; Coulomb blockade; doping level; nanowires; tunnel junction arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
  • Print_ISBN
    1-4244-0077-5
  • Type

    conf

  • DOI
    10.1109/NANO.2006.247678
  • Filename
    1717128