Title :
Photonic force microscopy with back-scattered light
Author :
Volpe, Giovanni ; Kozyreff, Gregory ; Petrov, Dmitri
Author_Institution :
ICFO-Institut de Ciencies Fotoniques, Mediterranean Technology Park, 08860 Castelldefels (Barcelona), Spain
Abstract :
We compare the sensitivity of the Photonic Force Microscope for the forward-scattering and backward-scattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach.
Keywords :
Biomedical optical imaging; Charge carrier processes; Electromagnetic scattering; Light scattering; Mie scattering; Optical microscopy; Optical scattering; Optical sensors; Particle scattering; Ultrafast optics;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431176
