Title :
Defect detection on patterned jacquard fabric
Author :
Ngan, Henry Y T ; Pang, Grantham K H ; Yung, S.P. ; Ng, Michael K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Abstract :
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.
Keywords :
fabrics; filtering theory; image segmentation; inspection; textile industry; wavelet transforms; automated patterned fabric inspection machine; defect detection; defective region segmentation; filtering process; golden image subtraction; patterned jacquard fabric; textile industry; visual inspection method; wavelet transform; Fabrics; Fourier transforms; Geographic Information Systems; Histograms; Image segmentation; Inspection; Mathematics; Testing; Wavelet transforms; Wiener filter;
Conference_Titel :
Applied Imagery Pattern Recognition Workshop, 2003. Proceedings. 32nd
Print_ISBN :
0-7695-2029-4
DOI :
10.1109/AIPR.2003.1284266
