Title : 
Reduced-Complexity Soft-Decision Aided PSK Detection
         
        
            Author : 
Xu, Chao ; Liang, Dandan ; Sugiura, Shinya ; Ng, Soon Xin ; Hanzo, Lajos
         
        
            Author_Institution : 
Sch. of ECS, Univ. of Southampton, Southampton, UK
         
        
        
        
        
        
            Abstract : 
In this paper, we propose to reduce the complexity of both the Approx-Log-MAP algorithm as well as of the Max-Log-MAP algorithm, which were designed for soft-decision aided PSK detectors. First of all, we extend the shown a posteriori PSK symbol probability formula and streamline it by eliminating its unnecessary calculations in the context of the Approx-Log-MAP algorithm. Secondly, we reduce the complexity of the Max-Log-MAP algorithm, where the maximum a posteriori symbol probability may be obtained without evaluating and comparing all the candidate symbol probabilities. Furthermore, we apply our new soft detection arrangement to a variety of coded systems. Our simulation results demonstrate that a significant detection complexity reduction was achieved by our design without any performance loss. For example, a factor two complexity reduction was achieved by the proposed Max-Log-MAP algorithm, when it was invoked for detecting QPSK symbols, which is expected to be significantly higher, when invoked for 16QAM.
         
        
            Keywords : 
communication complexity; encoding; maximum likelihood estimation; probability; quadrature amplitude modulation; quadrature phase shift keying; Approx-Log-MAP algorithm; Max-Log-MAP algorithm; PSK symbol probability formula; QAM; QPSK symbol; coded system; detection complexity reduction; maximum a posteriori symbol probability; reduced-complexity soft-decision aided PSK detection; soft detection arrangement; Algorithm design and analysis; Bit error rate; Capacity planning; Complexity theory; Detectors; Phase shift keying; Probability;
         
        
        
        
            Conference_Titel : 
Vehicular Technology Conference (VTC Fall), 2012 IEEE
         
        
            Conference_Location : 
Quebec City, QC
         
        
        
            Print_ISBN : 
978-1-4673-1880-8
         
        
            Electronic_ISBN : 
1090-3038
         
        
        
            DOI : 
10.1109/VTCFall.2012.6399198