Title :
Microwave device modelling using systematic optimization techniques
Author :
Patterson, A.D. ; Fusco, V.F. ; McKeown, J.J. ; Stewart, J.A.C.
Author_Institution :
Queen´´s Univ. of Belfast, UK
Abstract :
The authors demonstrate how the degree of ill-conditioning in a given model can be formally quantified using a sensitivity analysis of the sum of squares function. In addition a systematic new optimization technique is presented which improved the condition number of the problem so that rapid convergence and accurate solutions are ensured
Keywords :
optimisation; semiconductor device models; sensitivity analysis; solid-state microwave devices; active devices; convergence; full automatic scaling technique; microwave device modelling; model partitioning; sensitivity analysis; sum of squares function; systematic optimization techniques;
Conference_Titel :
Computer Based Tools for Microwave Engineers, IEE Colloquium on
Conference_Location :
London
